New PDF release: Atom Probe Tomography: Analysis at the Atomic Level

By M. K. Miller (auth.)

ISBN-10: 1461369215

ISBN-13: 9781461369219

ISBN-10: 1461542812

ISBN-13: 9781461542810

The microanalytical means of atom probe tomography (APT) allows the spatial coordinates and elemental identities of the person atoms inside of a small quantity to be decided with close to atomic answer. hence, atom probe tomography presents a strategy for buying atomic solution 3­ dimensional photographs of the solute distribution in the microstructures of fabrics. This monograph is designed to supply researchers and scholars the mandatory info to plot and experimentally behavior an atom probe tomography scan. The strategies required to imagine and to investigate the ensuing third-dimensional info also are defined. The monograph is geared up into chapters each one protecting a selected point of the approach. the improvement of this robust microanalytical process from the origins offield ion microscopy in 1951, in the course of the first third-dimensional atom probe prototype inbuilt 1986 to state-of-the-art advertisement cutting-edge 3­ dimensional atom probe is documented in bankruptcy 1. A basic creation to atom probe tomography can also be awarded in bankruptcy 1. many of the tips on how to fabricate compatible needle-shaped specimens are awarded in bankruptcy 2. The technique to shape box ion photographs of the needle-shaped specimen is defined in bankruptcy three. additionally, the looks of microstructural gains and the data that could be expected from box ion microscopy are summarized. a short account of the theoretical foundation for procedures of box ionization and box evaporation can be included.

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Blavette, University ofRouen, France. References 1. 2. 3. 4. 5. D. Blavette, E. Cadel, A. Fraczkiewicz and A. Menand, Science, in press. A. Menand, E. Cadel, C. Pareige and D. Blavette, Ultramicroscopy, 78 (1999) 63. K. , 47 (1999) 3127. M. K. Miller, S. S. Babu and M. G. Burke, Mater. Sci. , A270 (1999) 14. D. Blavette, G. Geandier, E. Cadel, F. Danoix and A. Menand, J de Phys. IV, 9 (1999) 113. Chapter 2 The Art of Specimen Preparation Atom probe field ion microscopy has been applied to a wide variety of materials ranging from pure metals and simple model alloys to complex multi component engineering alloys.

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