Read e-book online Field Emission in Vacuum Microelectronics (Microdevices) PDF

By George N. Fursey

ISBN-10: 0306474506

ISBN-13: 9780306474507

Box emission is a phenomenon defined via quantum mechanics. Its emission strength is hundreds of thousands occasions larger than that of the other recognized different types of electron emission. these days this phenomenon is experiencing a brand new existence as a result of magnificent functions within the atomic solution microscopy, in digital holography, and within the vacuum micro- and nanoelectronics quite often. the most box emission houses, and a few such a lot striking experimental evidence and purposes, are defined during this booklet.

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Additional resources for Field Emission in Vacuum Microelectronics (Microdevices)

Example text

The important result of Bardeen's research^^^ was the demonstration of the fact that the barrier due to the image potential is a good asymptotic approximation to the potential at sufficiently large distances from the surface. Juritchke^^^ found that, in quantum-mechanical terms, one can interpret the classic polarization of a metal in terms of an electron and a "hole" coupled by the exchange interaction and moving in opposite directions. Bardeen's potential is shown in Fig. 8a. 8. Different models of the potential barrier at metal-vacuum interface: (a) no external electric field; (b) with an external electric field F.

15. In the experiments^^' ^^ FM Miiller microscope was used to examine W, Mo, Nb, and Ta cathodes with tip radii of ro ^ (1-5) • 10"^ cm. It was found that the degree of emission-induced migration depends on the duration of the current pulse. Migration can be enhanced by repeated application of a voltage pulse for fixed durations, which causes "accumulation" of surface micro-roughness. As the surface micro-relief is changing, an appreciable increase in the emission current at fixed applied voltage occurs in the low current region.

Temperature distribution along the emitter axis of rotational symmetry. 4 nsec. If the energy input rate is great enough, relative to the time required to destroy the tip by tangential stress, injection of a stream-liquid mixture into the vacuum gap can occur. The kinetics of the heating process may be viewed in the following way. During the initial stage, the main contribution to heating of the emitter is due to the Nottingham effect, since the temperature of any point of the surface is lower than the inversion temperature.

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Field Emission in Vacuum Microelectronics (Microdevices) by George N. Fursey

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